Download: Multi-layer ceramic chip capacitors MCH18 (1608 (0603) size, chip capacitor)

Multi-layer ceramic chip capacitors MCH18 (1608 (0603) size, chip capacitor) !Features !External dimensions (Units : mm) 1) Small size (1.6 x 0.8 x 0.8 mm) makes it perfect for lightweight portable devices. 2) Comes packed either in tape to enable automatic mounting or in bulk cases. 3) Barrier layer and end terminations to improve 1.6±0.1 solderability. 4) Solder-coated terminals offer superior solderability and resistance to soldering heat. !Structure 0.15Min. 0.4Min. External electrode III (coating layer) Internal electrode External electrode II (barrier layer) Ceramic element External elec...
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Multi-layer ceramic chip capacitors MCH18 (1608 (0603) size, chip capacitor)

!Features !External dimensions (Units : mm) 1) Small size (1.6 x 0.8 x 0.8 mm) makes it perfect for lightweight portable devices. 2) Comes packed either in tape to enable automatic mounting or in bulk cases. 3) Barrier layer and end terminations to improve 1.6±0.1 solderability. 4) Solder-coated terminals offer superior solderability and resistance to soldering heat. !Structure 0.15Min. 0.4Min. External electrode III (coating layer) Internal electrode External electrode II (barrier layer) Ceramic element External electrode I (thick membrane layer) !Product designation Code Product thickness Packaging specifications Reel Basic ordering (pcs.) K 0.8mm Paper tape (width 8 mm, pitch 4 mm) φ180mm (7in.) 4,000 L 0.8mm Paper tape (width 8 mm, pitch 4 mm) φ330mm (13in.) 16,000 C 0.8mm Bulk case - 15,000 Ree l(φ180,φ330mm) : compatible with EIAJ ETX-7001 Bulk case : according to EIAJ ET-7201A Part No. Packaging style

MCH182F104ZK

Rated voltage Capacitance-temperature characteristics Nominal Capacitance tolerance Code Voltage Code EIA code Operating temperature (ºC) Temp. coefficient or percent change capacitance Code tolerance 2 25V C ±0.25pF (0.5 ~ 5pF) 3 16V A C0G - 55 to +125 0 ±30ppm / ºC D ±0.5pF (5.1 ~ 10pF) 4 10V 3-digit designation J ±5% (11pF or more) 5 50V according to IEC C,CN X7R - 55 to +125 ±15 % K ±10% F,FN Y5V - 30 to + 85 + 22%,- 82% Z +80%,-20% 0.8±0.1 0.8±0.1, !Capacitance range For thermal compensation Part number. MCH18 Part number. MCH18 Temperature A (C0G) Temperature A (C0G) characteristics characteristics Capacitance(pF) Rated voltage Capacitance (pF) Rated voltage (V) 50 (V) 50 Tolerance Tolerance 0.5 110 0.75 120 1 130 1.1 150 1.2 160 1.3 180 1.5 200 1.6 220 1.8 240 2 270 2.2 C ( ± 0.25pF) 300 J ( ± 5%) 2.4 330 2.7 360 3 390 3.3 430 3.6 470 3.9 510 4 560 4.3 620 4.7 680 5 750 5.1 820 5.6 910 6 1,000 6.2 6.8 Product thickness(mm) 0.8 ± 0.1 D ( ± 0.5pF) 7.5 8.2 9.1 J ( ± 5%), High dielectric constant Part number MCH18 Temperature characteristics C(X7R) CN(X7R) F(Y5V) FN(Y5V) Capacitance(pF) Rated voltage (V) 50 50 25 10 50 50 25 16 10 Tolerance K(±10%) K(±10%) Z(+80%, -20%) Z(+80%, -20%) 1,000 1,200 1,500 1,800 2,200 2,700 3,300 3,900 4,700 5,600 6,800 8,200 10,000 (0.01µF) 12,000 15,000 18,000 22,000 27,000 33,000 39,000 47,000 56,000 68,000 82,000 100,000 (0.1µF) 120,000 150,000 180,000 220,000 270,000 330,000 390,000 470,000 560,000 680,000 1,000,000 (1µF) 1,200,000 1,500,000 1,800,000 2,200,000 Product thickness (mm) 0.8 ± 0.1, !Characteristics Class 1 (For thermal compensation) Temperature characteristics Test methods / conditions A (C0G) (based on JIS C 5102) Item Operating temperature - 55ºC ~ + 125ºC Based on paragraph 7.8 and paragraph 9 Nominal capacitance (C) Must be within the specified tolerance range. Measured at room temperature and standard humidity. 1000pF or less Measurement frequency : 1± 0.1MHz 100 / (400 + 20C)% or less Measurement voltage : 1± 0.1Vrms. (Less than 30 pF) Over 1000pF Measurement frequency : 1± 0.1kHzDissipation factor (tan δ ) 0.1% or less (30 pF or larger) Measurement voltage : 1± 0.1Vrms. Based on paragraph 7.6 Insulation resistance (IR) 10,000 MΩ or 500ΜΩ⋅µF, whichever is smaller Measurement is made after rated voltage is applied for 60 ± 5s. Based on paragraph 7.1 Withstanding voltage The insulation must not be damaged. Apply 300% of the rated voltage for 1 to 5s then measure. Temperature characteristics The temperature coefficients in table 12, paragraph Within 0 ± 30ppm / ºC 7.12 are calculated at 20ºC and high temperature. Based on paragraph 8.11.2 Terminal adherence Apply 5N (0.51 kg · f) for 10 ± 1s No detachment or signs of detachment. in the direction indicated Pressure (5N) by the arrow. Test boardCapacitor Appearance There must be no mechanical damage. Chip is mounted to a board in the Resistance manner shown on the right, subjected to vibration Rate of capacitance change Must be within initial tolerance. to vibration (type A in paragraph 8.2), and measured 24 ± 2 hrs. later. Board Dissipation factor (tanδ) Must satisfy initial specified value. Based on paragraph 8.13 Solderability At least 3 / 4 of the surface of the two terminals Soldering temperature : 235 ± 5ºC must be covered with new solder. Soldering time : 2 ± 0.5s Appearance There must be no mechanical damage. Rate of capacitance change ± 2.5% or ± 0.25 pF, whichever is larger. Based on paragraph 8.14 Resistance Dissipation factor (tanδ) Must satisfy initial specified value. Soldering temperature : 260 ± 5ºCto soldering Soldering time : 5 ± 0.5s heat Insulation resistance 10,000 MΩ or 500ΜΩ⋅µF , whichever is smaller Preheating : 150 ± 10ºC for 1 to 2 min. Withstanding voltage The insulation must not be damaged. Appearance There must be no mechanical damage. Based on paragraph 9.3 Temperature Rate of capacitance change ± 2.5% ± 0.25 pF, whichever is larger. cycling Number of cycles: 10 Dissipation factor (tanδ) Must satisfy initial specified value. Capacitance measured after 24 ± 2 hrs. Insulation resistance 10,000 MΩ or 500ΜΩ⋅µF , whichever is smaller Appearance There must be no mechanical damage. Based on paragraph 9.9 Test temperature : 40 ± 2ºC Rate of capacitance change ± 7.5% or ± 0.75 pF , whichever is larger. Humidity load Relative humidity : 90% to 95% test Applied voltage : rated voltageDissipation factor (tanδ) 0.5% or less Test time : 500 to 524 hrs. Insulation resistance 500 MΩ or 25ΜΩ⋅µF, whichever is smaller Capacitance measured after 24 ± 2 hrs. Appearance There must be no mechanical damage. Based on paragraph 9.10 High- Rate of capacitance change ± 3.0% or ± 0.3 pF , whichever is larger. Test temperature : Max. operating temp. temperature Applied voltage : rated voltage x 200% load test Dissipation factor (tanδ) 0.3% or less Test time : 1,000 to 1,048 hrs. Capacitance measured after 24 ± 2 hrs. Insulation resistance 1,000 MΩ or 50ΜΩ⋅µF , whichever is smaller, Class 2 (High dielectric constant ) Temperature characteristics Test methods / conditions C,CN (X7R) F,FN(Y5V) (based on JIS C 5102) Item Operating temperature - 55ºC~ + 125ºC - 30ºC~ + 85ºC Nominal capacitance (C) Must be within the specified tolerance range. Rated Voltage Rated Voltage Based on paragraph 7.8 50V : 3.0% or less 50V : 5.0% or less Measured at room temperature and standard humidity. tan δ Measurement frequency 25V : 3.0% or less 25V : 7.5% or less : 1 ± 0.1 kHzMeasurement voltage : 1.0 ± 0.2 Vrms. 16V : 10.0% or less 10,000 MΩ or 500MΩ·µF, whichever is smaller. Based on paragraph 7.6 Insulation resistance (IR) Measurement is made after rated voltage (Rated Voltage 16V,10V : 10,000MΩ or 100MΩ·µF, whichever is smaller.) is applied for 60 ± 5s. Based on paragraph 7.1 Withstanding voltage The insulation must not be damaged. Apply 250% of the rated voltage for 1 to 5s then measure. The temperature coefficients in paragraph 7.12, Temperature characteristics Within ± 15% Within ± 22, - 82% table 8, condition B, are based on measurements carried out at 20ºC, with no voltage applied. Based on paragraph 8.11.2 Apply 5N (0.51 kg · for 10 ± 1s Terminal adherence No detachment or signs of detachment. in the direction indicated Pressure (5N) by the arrow. Test boardCapacitor Appearance There must be no mechanical damage. Chip is mounted to a board in the manner Resistance shown on the right, subjected to vibration to vibration Rate of capacitance change Within ± 7.5% Within ± 20% (type A in paragraph 8.2), and measured 48 ± 4 hrs. later. Board Dissipation factor (tan δ) Must satisfy initial specified value. Based on paragraph 8.13 Solderability At least 3 / 4 of the surface of the two terminals must be covered with new solder. Soldering temperature : 235 ± 5ºC Soldering time : 2 ± 0.5s Appearance There must be no mechanical damage. Rate of capacitance change Within ± 7.5% Within ± 20.0% Based on paragraph 8.14 Resistance Dissipation factor (tan δ) Must satisfy 2.0 times of initial specified value. Must satisfy 1.5 times of initial specified value. Soldering temperature : 260 ± 5ºC to soldering Soldering time : 5 ± 0.5s heat 10,000 MΩ or 500MΩ·µF, whichever is smaller.Insulation resistance Preheating : 150 ± 10ºC for (Rated Voltage 16V,10V : 10,000MΩ or 100MΩ·µF, whichever is smaller.) 1 to 2 min. Withstanding voltage The insulation must not be damaged. Appearance There must be no mechanical damage. Rate of capacitance change Within ± 7.5% Within ± 20.0% Based on paragraph 9.3 Temperature Number of cycles: 5 cycling Dissipation factor (tan δ) Must satisfy 2.0 times of initial specified value. Must satisfy 1.5 times of initial specified value. Capacitance measured after 48 ± 4 hrs. 10,000 MΩ or 500MΩ·µF, whichever is smaller. Insulation resistance (Rated Voltage 16V,10V : 10,000MΩ or 100MΩ·µF, whichever is smaller.) Appearance There must be no mechanical damage. Based on paragraph 9.9 Rate of capacitance change ± 12.5% or less Within ± 30.0% Test temperature : 40 ± 2ºC Humidity load Relative humidity : 90% to 95% test Dissipation factor (tan δ) Must satisfy 2.0 times of initial specified value. Must satisfy 1.5 times of initial specified value. Applied voltage : rated voltage Test time : 500 to 524 hrs. 500 MΩ or 25MΩ·µF, whichever is smaller. Insulation resistance Capacitance measured after 48 ± 4 hrs. (Rated Voltage 16V,10V : 500MΩ or 5MΩ·µF, whichever is smaller.) Appearance There must be no mechanical damage. Based on paragraph 9.10 High- Rate of capacitance change Within ± 10.0% Within ± 30.0% Test temperature : Max. operating temp. temperature Must satisfy 2.0 times of initial specified value. Must satisfy 1.5 times of initial specified value. Applied voltage : rated voltage load test Dissipation factor (tan δ) Test time : 1,000 to 1,048 hrs. 1,000 MΩ or 50MΩ·µF, whichever is smaller. Capacitance measured after 48 ± 4 hrs. Insulation resistance (Rated Voltage 16V,10V : 1,000MΩ or 10MΩ·µF, whichever is smaller.), !Packaging specifications (Units : mm)

Taping Reel

φ180 mm plastic reel 11.4 ±1.0 4.0 ±0.1 φ1.5 +0.1 2.0 ±0.05 0 1.05Max. 4.0±0.1 Label position φ330 mm plastic reel 13.5 ±1.0 1.1±0.1 1.2Max. MCH (paper taping) Pull direction Label position

EIAJ ETX-7001 compliant Bulk case

slider shutter

EIAJ ET-7201A compliant MCH18 15,000pcs / case

1.9±0.1 3.5 ±0.05 1.75 ±0.1 8.0 ±0.3 9.5 ±0.5 φ13 ±0.2 φ13 ±0.2 9.0 ±0.3 φ80 ±1 φ60+1 0 φ330 ±2 φ180 0-3, !Electrical characteristics " A (C0G) Characteristics 5 1000000 2 10000 -1 100 1pF -2 10 -3 10pF -4 100pF -5 0.1 - 50 0 50 100 1 10 100 1000 10000 TEMPERATURE: (˚C) FREQUENCY (MHz) Fig.1 Capacitance - temperature Fig.2 Impedance - frequency characteristics characteristics "C (X7R) Characteristics ∆ C / C 0 100 -10 -20 10 -30 1 1,000pF 10,000pF 0.1 10 0.01 100,000pF Tanδ50.001 -50 0 50 100 1 10 100 1000 10000 FREQUENCY (MHz) TEMPERATURE: (˚C) Fig.3 Capacitance - temperature Fig.4 Impedance - frequency characteristics characteristics "F (Y5V) Characteristics 10 1000 0 ∆ C / C -10 -20 -30 -40 16 10 -50 14 -60 12 1 1,000pF -70 10 Tan δ -80 8 0.1 10,000pF -9064100,000pF0.01 -40 -20 0 20 40 60 80 100 0.001 1 10 100 1000 10000 TEMPERATURE: (˚C) FREQUENCY (MHz) Fig.5 Capacitance - temperature Fig.6 Impedance - frequency characteristics characteristics *The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. RATE OF CAPACITANCE CHANGE: (%) RATE OF CAPACITANCE CHANGE: (%) RATE OF CAPACITANCE CHANGE: (%) tanδ (%) tanδ (%) IMPEDANCE (Ω) IMPEDANCE (Ω) IMPEDANCE (Ω), " Temperature cycling test

A (C0G) Characteristics (100pF)

3.0 0.6 JIS C 5102 9. 3 JIS C 5102 9. 3 SAMPLE SIZE: n = 50pcs SAMPLE SIZE: n = 50pcs JIS C 5102 9. 3 - 55/ + 125˚C 100cyc SAMPLE SIZE: n = 50pcs - 55/ + 125˚C 100cyc 2.0 0.5 - 55/ + 125˚C 100cyc 1×1012 1.0 0.4 0 0.3 1×1011 - 1.0 0.2 - 2.0 0.1 - 3.0 0 1×10 INITIAL VALUE TESTED INITIAL VALUE TESTED INITIAL VALUE TESTED

Fig.7 Rate of capacitance change Fig.8 Tanδ Fig.9 Insulation resistance C (X7R) Characteristics (1,000pF)

15.0 6.0 JIS C 5102 9. 3 JIS C 5102 9. 3 JIS C 5102 9. 3 SAMPLE SIZE: n = 50pcs SAMPLE SIZE : n = 50pcs SAMPLE SIZE : n = 50pcs - 55/ + 125˚C 100cyc 10.0 - 55/ + 125˚C 100cyc5.0 - 55/ + 125˚C 100cyc 1×1012 5.0 4.0 0 3.0 1×1011 - 5.0 2.0 - 10.0 1.0 - 15.0 0 1×10 INITIAL VALUE TESTED INITIAL VALUE TESTED INITIAL VALUE TESTED

Fig.10 Rate of capacitance change Fig.11 Tanδ Fig.12 Insulation resistance F (Y5V) Characteristics (10,000pF)

30.0 6.0 JIS C 5102 9. 3 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs SAMPLE SIZE : n = 50pcs JIS C 5102 9. 3 - 30/ + 85˚C 100cyc - 30/ + 85˚C 100cyc SAMPLE SIZE: n = 50pcs 20.0 5.0 - 30/ + 85˚C 100cyc 1×1012 10.0 4.0 0.0 3.0 - 10.0 2.0 1×10 - 20.0 1.0 - 30.0 0 1×1010 INITIAL VALUE TESTED INITIAL VALUE TESTED INITIAL VALUE TESTED

Fig.13 Rate of capacitance change Fig.14 Tanδ Fig.15 Insulation resistance

*The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. RATE OF CAPACITANCE CHANGE: (%) RATE OF CAPACITANCE CHANGE: (%) RATE OF CAPACITANCE CHANGE: (%) tanδ: (%) tanδ: (%) tanδ: (%) IR: (Ω) IR: (Ω) IR: (Ω), " High-temperature load test

A (C0G) Characteristics (100pF)

3.0 0.6 JIS C 5102 9. 10 JIS C 5102 9. 10 SAMPLE SIZE: n = 50pcs SAMPLE SIZE: n = 50pcs 2.0 + 125˚C 1,000h 0.5 + 125˚C 1,000h OVERLOAD: 200% RATED VOLTAGE OVERLOAD: 200% RATED VOLTAGE 1×1012 1.0 0.4 0.0 0.3 1×1011 - 1.0 0.2 JIS C 5102 9. 10 0.1 SAMPLE SIZE: n = 50pcs- 2.0 + 125˚C 1,000h OVERLOAD: 200% RATED VOLTAGE - 3.0 0 1×10 0 240 480 720 1000 0 240 480 720 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h)

Fig.16 Rate of capacitance change Fig.17 Tanδ Fig.18 Insulation resistance C(X7R)Characteristics(1,000pF)

15.0 6.0 JIS C 5102 9. 10 JIS C 5102 9. 10 JIS C 5102 9. 10 SAMPLE SIZE: n = 50pcs SAMPLE SIZE: n = 50pcs SAMPLE SIZE: n = 50pcs 10.0 +125˚C 1,000h 5.0 + 125˚C 1,000h + 125˚C 1,000h OVERLOAD: 200% RATED VOLTAGE OVERLOAD: 200% RATED VOLTAGE 1×1012 OVERLOAD: 200% RATED VOLTAGE 5.0 4.0 0 3.0 1×1011 - 5.0 2.0 - 10.0 1.0 - 15.0 0 1×1010 0 240 480 720 1000 0 240 480 720 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h)

Fig.19 Rate of capacitance change Fig.20 Tan δ Fig.21 Insulation resistance F (Y5V) Characteristics (10,000pF)

30.0 6.0 JIS C 5102 9. 10 JIS C 5102 9. 10 SAMPLE SIZE: n = 50pcs SAMPLE SIZE : n = 50pcs 20.0 + 85˚C 1,000h 5.0 + 85˚C 1,000h OVERLOAD: 200% RATED VOLTAGE 1×1012 OVERLOAD : 200% RATED VOLTAGE 10.0 4.0 0.0 3.0 1×1011 - 10.0 2.0 JIS C 5102 9. 10 SAMPLE SIZE: n = 50pcs - 20.0 1.0 + 85˚C 1,000h OVERLOAD: 200% RATED VOLTAGE 0 1×1010- 30.0 0 240 480 720 1000 0 240 480 720 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h)

Fig.22 Rate of capacitance change Fig.23 Tanδ Fig.24 Insulation resistance

*The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. RATE OF CAPACITANCE CHANGE: (%) RATE OF CAPACITANCE CHANGE: (%) RATE OF CAPACITANCE CHANGE: (%) tanδ: (%) tanδ: (%) tanδ: (%) IR: (Ω) IR: (Ω) IR: (Ω), " Humidity load test

A (C0G) Characteristics (100pF)

3.0 JIS C 5102 9. 9 0.6 SAMPLE SIZE: n = 50pcs JIS C 5102 9. 9 2.0 + 40˚C 90 ~ 95%RH 1,000h SAMPLE SIZE: n = 50pcs OVERLOAD: THE RATED VOLTAGE 0.5 + 40˚C 90 ~ 95%RH 1,000h OVERLOAD: THE RATED VOLTAGE 1×1012 1.0 0.4 0.0 0.3 - 1.0 1×1011 0.2 JIS C 5102 9. 9 - 2.0 SAMPLE SIZE: n = 50pcs 0.1 + 40˚C 90~95%RH 1,000h OVERLOAD: THE RATED VOLTAGE - 3.0 1×10100 240 480 720 100000240 480 720 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h)

Fig.25 Rate of capacitance change Fig.26 Tan δ Fig.27 Insulation resistance C (X7R) Characteristics (1,000pF)

15.0 6.0 JIS C 5102 9. 9 JIS C 5102 9. 9 JIS C 5102 9. 9 SAMPLE SIZE: n = 50pcs SAMPLE SIZE: n = 50pcs SAMPLE SIZE: n = 50pcs 10.0 + 40˚C 90 ~ 95%RH 1,000h 5.0 + 40˚C 90~95%RH 1,000h + 40˚C 90~95%RH 1,000h OVERLOAD: THE RATED VOLTAGE OVERLOAD: THE RATED VOLTAGE × 12 OVERLOAD: THE RATED VOLTAGE1 10 5.0 4.0 0 3.0 - 5.0 2.0 1×10 - 10.0 1.0 - 15.0 0 1×1010 0 240 480 720 1000 0 240 480 720 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h)

Fig.28 Rate of capacitance change Fig.29 Tanδ Fig.30 Insulation resistance F (Y5V) Characteristics (10,000pF)

30.0 6.0 JIS C 5102 9. 9 JIS C 5102 9. 9 SAMPLE SIZE: n = 50pcs SAMPLE SIZE: n = 50pcs 20.0 + 40˚C 90 ~ 95%RH 1,000h + 40˚C 90 ~ 95%RH 1,000h5.0 OVERLOAD: THE RATED VOLTAGE × 12 OVERLOAD: THE RATED VOLTAGE1 10 10.0 4.0 0.0 3.0 1×1011 - 10.0 2.0 JIS C 5102 9. 9 SAMPLE SIZE: n = 50pcs - 20.0 1.0 + 40˚C 90 ~ 95%RH 1,000h OVERLOAD: THE RATED VOLTAGE - 30.0 1×10100 0 240 480 720 1000 0 240 480 720 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h)

Fig.31 Rate of capacitance change Fig.32 Tanδ Fig.33 Insulation resistance

*The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. RATE OF CAPACITANCE CHANGE: (%) RATE OF CAPACITANCE CHANGE: (%) RATE OF CAPACITANCE CHANGE: (%) tanδ: (%) tanδ : (%) tanδ: (%) IR: (Ω) IR: (Ω) IR: (Ω)]
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